Advanced design activities are focusing on the field of specific on-resistance as being the major benchmark parameter for any given technology. Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy. Silicon carbide powder could be used in a variety of industrial and manufacturing applications, such as: https://www.facebook.com/permalink.php?story_fbid=pfbid02qEvHBJkYNnAjKH7oeoMT6ngHxaUsjm4aCsFYnW733Ef1uCkJBBQxCCiodGQ2CnNvl&id=61562415773754&__cft__[0]=AZUpLbxJB_sNrOWzB8NZnlU5Fo48ojrf5olu_3iIngw0xwKD3UDWiJJLGdNBAtvyqVawJeaSr10z3mb_rMHiG7smj1i1e_QDbJr6fwlbnDnC33j72fqzGqRHF5IjOPbM2h7h_MbBP8xFi0UgiyOWvT6N0hCTMZYIENbVNoZ2JqN4AGSLIVRhHud8_Qfxa3Ag7o-ghUFx5kVjjVXTTSO8fYdI&__tn__=%2CO%2CP-R